Fundamentals of Mass Spectrometry -Secondary Ion Mass Spectrometry (SIMS), Cluster SIMS, and Electrospray Droplet Impact SIMS-
نویسندگان
چکیده
منابع مشابه
Secondary Ion Mass Spectrometry (SIMS): principles and applications
This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique in varied scientific fields. Handbook of instrumental techniques from CCiTUB Secondary Ion Mass Spectrometry MT.10
متن کاملSecondary Ion Mass Spectrometry ( SIMS ) Fe 57 Conversion
This paper considers the application of surface-analytical techniques to characterize both thin (-2 nm) passive oxide films and thick (up to 1 pm) oxides formed on metals and alloys a t high temperature. Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), Mossbauer spectroscopy, X-ray absorption near edge spectroscopy (XANES), secondary ion mass spectrometry (SIMS) and el...
متن کاملAnalysis of Conducting and Insulating Surfaces by Means of Secondary Ion Mass Spectrometry (SIMS)
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
متن کاملMinor congeners of antrimycin: application of secondary ion mass spectrometry (SIMS) to structure determination.
Sir: Previously, we reported the isolation1) and structure determination 2) of antrimycin A*, a linear heptapeptide showing antitubercular activity (see Fig. 1). Recently, we found that Streptomyces _xauthocidicus MG125-CFI, an antrimycin-producing microorganism, produces a small amount of several minor congeners besides antrimycin A. In this communication, isolation and structure determination...
متن کاملStatic secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates.
The feasibility of static secondary ion mass spectrometry (S-SIMS) for the detection of molecule specific information from complex materials, such as natural clay and soil samples, has been investigated. Ion trap (IT), as well as triple quadrupole (TQ) instruments, have been used for mass analysis. Secondary ion images have been acquired using time-of-flight (TOF) S-SIMS. The generation of mole...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Mass Spectrometry Society of Japan
سال: 2010
ISSN: 1340-8097,1880-4225
DOI: 10.5702/massspec.58.175